Journal article

Real time surface measurement technique in a wide range of wavelengths spectrum

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Author list: THIM J, O'NILS M, MANUILSKIY A, Alam A, O'NILS M, MANUILSKIY A, THIM J

Publication year: 2014

Start page: 285

End page: 294

Number of pages: 10

ISSN: 1530-437X

DOI: http://dx.doi.org/10.1109/JSEN.2013.2281913

View additional information: View in Web of Science


Abstract

Real time surface topography measurement in the paper and paperboard industries is a challenging research field. The existing online techniques measure only a small area of paper surface and estimate topographical irregularities in a narrow scale as a single predictor. Considering the limitations and complications in measuring the surface at high speed, a laser line triangulation technique is explored to measure surface topography in a wide scale. The developed technique is new for the paper and paperboard application that scans a line onto the paper-web surface up to 210 mm in length in the cross machine direction. The combination of a narrow laser linewidth imaging, a subpixel resolution, and the selection of a unique measurement location has made it possible to measure roughness and simultaneously characterize paper surface topography from 0.1 to 30 mm spatial wavelength. This spatial range covers wide scale surface properties such as roughness, cockling, and waviness. The technique clearly distinguishes and characterizes the surface of newspaper, and lightweight coated, coated, and uncoated paperboard in real time during the paper manufacturing process. The system temporal noise for the average roughness is estimated as 37 dB. The signal to noise ratio found is from 5.4 to 8.1 in the short spatial wavelength up to 1 mm, whereas it is more than 75 in the long spatial wavelength from 5 to 10 mm.


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