Journal article

X-ray imaging using single photon processing with semiconductor pixel detectors

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Publication Details

Author list: Llopart Cudié, Xavier

Publication year: 2003

Start page: 282

End page: 286

Number of pages: 5

ISSN: 0168-9002

DOI: http://dx.doi.org/10.1016/S0168-9002(03)01807-2

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Abstract

More than 10 years experience with semiconductor pixel detectors for vertex detection in high-energy physics experiments together with the steady progress in CMOS technology opened the way for the development of single photon processing pixel detectors for various applications including medical X-ray imaging. The state of the art of such pixel devices consists of pixel dimensions as small as 55×55 µm2, electronic noise per pixel <100 e- rms, signal-to-noise discrimination levels around 1000 e- with a spread <50 e- and a dynamic range up to 32 bits/pixel. Moreover, the high granularity of hybrid pixel detectors makes it possible to probe inhomogeneities of the attached semiconductor sensor.


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