Journal article

Contact Resistance of Thin Metal Film Contacts

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Publication Details

Author list: Dejanovic, Slavko;Hesselbom, Hjalmar;Norberg, Gunnar

Publication year: 2006

Start page: 371

End page: 378

Number of pages: 8

ISSN: 1521-3331

DOI: http://dx.doi.org/10.1109/TCAPT.2006.875891

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Abstract

To be able to reduce the size of products having electronic devices, it becomes more and more important to miniaturize the electro-mechanical parts of the system. The use of micro mechanical connectors and contact structures implies the need of methods for estimating the properties of such devices. This work will, by use of finite element modeling, treat the influence of a thin film constituting at least one of the contacting members of an electrical contact. The error introduced by using the traditional Maxwell/Holm contact constriction resistance theory will be investigated. Numerical methods are used to present a way to approximate the total resistance for the thin metal film contact.


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