Journal article

A CMOS APS for dental X-ray imaging using scintillating sensors

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Author list: Abdalla, Munir A;Fröjdh, Christer;Petersson, Sture

Publication year: 2001

Start page: 197

End page: 203

Number of pages: 7

ISSN: 0168-9002

DOI: http://dx.doi.org/10.1016/S0168-9002(00)01114-1

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Abstract

In this paper we present an integrating CMOS Active Pixel Sensor (APS) circuit to be used with scintillator type X-ray sensors for intra oral dental X-ray imaging systems. Different pixel architectures were constructed to explore their performance characteristics and to study the feasibility of the development of such systems using the CMOS technology. A prototype 64×80 pixel array has been implemented in a CMOS 0.8 µm double poly n-well process with a pixel pitch of 50 µm. A spectral sensitivity measurement for the different pixels topologies, as well as measured X-ray direct absorption in the different APSs are presented. A measurement of the output signal showed a good linearity over a wide dynamic range. This chip showed that the very low sensitivity of the CMOS APSs to direct X-ray exposure adds a great advantage to the various CMOS advantages over CCD-based imaging systems.


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